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Kim Wins Second Consecutive Best Paper Award at IEEE AUTOTESTCON

Kim Wins Second Consecutive Best Paper Award at IEEE AUTOTESTCON

Seokjin Kim (left) receives the best student paper award at IEEE AUTOTESTCON.
Seokjin Kim (left) receives the best student paper award at IEEE AUTOTESTCON.

For the second year in a row, ECE 2008 Ph.D. graduate Seokjin Kim won the best student paper award at IEEE AUTOTESTCON, the world's only conference focused primarily on automated test for integrated systems technology aimed at military, government and aerospace applications. The conference, hosted by the Institute of Electrical & Electronic Engineers (IEEE), was held in Salt Lake City, Utah, from Sept. 8-11, 2008.

Seokjin won the award for a paper titled "High-speed ADC Dynamic Performance Validation: the Impact of Skew-corner Lot Testing." Seokjin was advised by ECE Professor Martin Peckerar.

Kim took home the best student paper cash award of $400, as well as the student travel award from the IEEE Aerospace and Electronic Systems Society, worth $2,000.

For more information about IEEE AUTOTESTCON, visit: http://www.autotestcon.com/.

September 16, 2008


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