Jon Orloff
Professor
Department of Electrical and Computer Engineering
&
Institute for Research in Electronics and Applied
Physics
Research Interests
·
High resolution focused ion beams and their
applications
·
High brightness electron and ion sources
Education
·
B.S. M.I.T. 1964
·
Ph.D. Oregon
Graduate Institute 1977
Prof. Orloff worked for many years at the Oregon Graduate
Institute where he developed high resolution focused ion beam (FIB) technology based on field emission
ions sources, in particular the liquid metal ion source. This technology is an essential tool for
semiconductor device fabrication and design.
He has also been active in the development of high resolution SEM
technology and, while a professor in
Example of FIB applications: IC cross
sectioning
and scanning ion microscopy
Contact information:
Telephone: 1-301-405-5022
e-mail: jono@eng.umd.edu
snail mail: Energy Research Facility